Addressing the challenges of capturing the intricate relationships between microstructure and material properties when processing and analyzing composite materials.
This application note explores how 3D Nanoprinting (3DNP) via Focused Electron Beam Induced Deposition (FEBID) offers a powerful and mature solution for creating high-performance and even multifunctional AFM nanotips.
Pushing Correlative Microscopy to the Next Level: Advanced Characterization of Plasmonic Nanostructures
Combining AFM and SEM for the mechanical and electrical probing of nanostructures.
Extract individual particle morphologies, surface roughness, and potential surface contaminations with correlative imaging and force-distance curve analysis.
Extract real 3D topography on hard to reach sample areas with sub-nanometer resolution and correlative SEM imaging.
Use complementary information from SEM and AFM to image complex samples like razor blades with nanometer precision.
