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Learn MoreThis application note highlights the benefits of combining FusionScope and micromanipulators to analyze samples such as individual nanowires, locally biased electrode structures, and electronic devices.
Learn MoreThis application note demonstrates the power of correlative microscopy to characterize plasmonic nanostructures, which exhibit unique optical properties that enable cutting-edge applications in sensing, optoelectronics, and quantum technologies.
Learn MoreCombine the complementary strengths of AFM and SEM like never before! The FusionScope fully integrates a wide range of advanced AFM measurement techniques with the benefits of SEM imaging and EDS elemental analysis. Seamlessly image your sample, identify areas of interest, measure your sample, and combine your imaging data in real time.
Perform a complete suite of characterization techniques ranging from high-resolution AFM and SEM imaging to analyzing topographical, nanomechanical, chemical, electrical, and magnetic properties with the power of correlative microscopy.
FusionScope gives you full freedom to accurately position your sample. With Profile View – an 80-degree tilt of the combined sample stage and AFM scan head – you can position the AFM tip quickly and precisely, even on complex and challenging sample surfaces.
FusionScope's custom software was specifically designed to make correlative microscopy easy and intuitive. Enjoy a user interface that provides automation for most routine functions within an intuitive and customizable user interface. Intelligent data handling organizes all your AFM and SEM data for easy access in the future.
Featuring an innovative shared coordinate system to automatically align AFM and SEM operations for measurements and sample positioning, within a single software interface you now can easily identify your area of interest, measure your sample, and combine your imaging data in real time.
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