Open a World of Easy-to-Use Correlative Microscopy
Combine AFM with SEM in All New Ways
Latest Updates
- FusionScope Successfully Installed at Quantum Design Japan Offices
- New Publication: Additive Manufacturing of Co3Fe Nano-Probes
- New App Note: Correlative Analysis of Bone Collagen
- Visit Us at Advanced Materials Show in UK!
FusionScope is an easy-to-use correlative microscopy platform designed from the ground up to add the benefits of SEM imaging to a wide range of AFM measurement techniques.
Combine the complementary strengths of AFM and SEM like never before! The FusionScope fully integrates a wide range of advanced AFM measurement techniques with the benefits of SEM imaging. Seamlessly image your sample, identify areas of interest, measure your sample, and combine your imaging data in real time.
Electrical, nanomechanical, and magnetic properties of your sample are just a click away.
Perform a complete suite of characterization techniques ranging from high-resolution AFM and SEM imaging to analyzing topographical, nanomechanical, chemical, electrical, and magnetic properties with the power of correlative microscopy.
Position the AFM precisely at your region of interest.
FusionScope gives you full freedom to accurately position your sample. With Profile View – an 80-degree tilt of the combined sample stage and AFM scan head – you can position the AFM tip quickly and precisely, even on complex and challenging sample surfaces.
Focus on your research and let FusionScope do the rest.
FusionScope's custom software was specifically designed to make correlative microscopy easy and intuitive. Enjoy a user interface that provides automation for most routine functions within an intuitive and customizable user interface. Intelligent data handling organizes all your AFM and SEM data for easy access in the future.
Discover new properties of your samples using advanced techniques combined with our easy-to-use custom software interface.
Featuring an innovative shared coordinate system to automatically align AFM and SEM operations for measurements and sample positioning, within a single software interface you now can easily identify your area of interest, measure your sample, and combine your imaging data in real time.
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