App Notes & Publications

Publications

Nanoparticle Characterization with In Situ AFM-SEM-EDS

(July 2024)

In Situ AFM-SEM-EDS, a Correlative Microscopy Platform for Surface Characterization and Elemental Analysis

(July 2024)

Deep-reactive ion etching of silicon nanowire arrays at cryogenic temperatures

(April 2024)

Fungal Carbon: A Cost-Effective Tunable Network Template for Creating Supercapacitors

(March 2024)

Spectral Tuning of Plasmonic Activity in 3D Nanostructures via High-Precision Nano-Printing

(December 2023)

A Highly Integrated AFM-SEM Correlative Analysis Platform

(November 2023)

FusionScope - Additive Manufacturing of Co3Fe Nano-Probes for Magnetic Force Microscopy

Additive Manufacturing of Co₃Fe Nano-Probes for Magnetic Force Microscopy

(March 2023)

FusionScope - Complementary evaluation of potential barriers in semiconducting barium titanate by electrostatic force microscopy and capacitance–voltage measurements

Complementary evaluation of potential barriers in semiconducting barium titanate by electrostatic force microscopy and capacitance–voltage measurements

(June 2022)

Application Notes

Combined SEM and AFM Particle Analysis of Vitamin C Using FusionScope

Extract individual particle morphologies, surface roughness, and potential surface contaminations with correlative imaging and force-distance curve analysis.

(September 2024)

Correlative In-Situ AFM & SEM Analysis of Bone Collagen at the Nanoscale

Extract real 3D topography on hard to reach sample areas with sub-nanometer resolution and correlative SEM imaging.

(March 2023)

Cutting Edge Measurements with the FusionScope

Use complementary information from SEM and AFM to image complex samples like razor blades with nanometer precision.

(September 2022)

Conference Posters

A Novel Tool for Combined AFM, SEM, and Electrical Probing of Nanostructures

(August 2024)

Nanoscale Correlative Analysis of Hard-to-Reach Sample Areas by Combination of AFM and SEM

(June 2024)

A Highly Integrated Correlative Microscopy Platform

(June 2024)

FusionScope Conference Poster - Two microscopes are better than one – A unique new inspection tool for micro/nanostructures by combination of AFM and SEM

Two microscopes are better than one – A unique new inspection tool for micro/nanostructures by combination of AFM and SEM

(February 2023)