Pushing Correlative Microscopy to the Next Level: Advanced Characterization of Plasmonic Nanostructures
Combining AFM and SEM for the mechanical and electrical probing of nanostructures.
Extract individual particle morphologies, surface roughness, and potential surface contaminations with correlative imaging and force-distance curve analysis.
Extract real 3D topography on hard to reach sample areas with sub-nanometer resolution and correlative SEM imaging.
Use complementary information from SEM and AFM to image complex samples like razor blades with nanometer precision.
